This release is available in German. Jena (21 October 2010) Scientists from the Friedrich-Schiller-University Jena (Germany) were successful in improving a fabrication process for Atomic Force ...

Atomic force microscopy (AFM) is a standard imaging technique for the structural characterization of surfaces in different fields of materials science, surface science, and biology. Carbon nanotubes ...

An AFM instrument uses a probe with an atomically sharp tip to scan over the surface of a material. There are two main scanning modes with an AFM instrument: contact or dynamic (tapping) mode. Both ...

Atomic force microscopy (AFM) is a type of scanning probe microscopy that is used to see and measure surface topography, conduct force measurements or manipulate a sample’s surface. It can have nearly ...

New research demonstrates that novel probe technology based on flexible membranes can replace conventional atomic force microscopy (AFM) cantilevers for applications such as fast topographic imaging, ...

A team of researchers from NYU Abu Dhabi's Advanced Microfluidics and Microdevices Laboratory (AMMLab) have developed new kind of Atomic Force Microscopy (AFM) probes in true three-dimensional shapes ...

(Nanowerk Spotlight) The foremost atom of the tip in a scanning probe microscope is critically important for precise imaging results – similar to role of the objective lens in an optical microscope.

(Nanowerk News) Nanographene is a material that is anticipated to radically improve solar cells, fuel cells, LEDs and more. Typically the synthesis of this material has been imprecise and difficult to ...