The VALID SL in-circuit and functional test system is designed for high-channel-count testing in demanding electronics manufacturing environments. Introduces a cable-free architecture with new ...

Test engineers have a new tool to verify the operation of complex, non-boundary-scan clusters: JFT (JTAG Functional Test) from JTAG Technologies. In addition to its ActiveTest tool, JTAG Technologies' ...

SE: Why is applying functional test content so challenging today? Ruiz: There are a couple of different factors that make successfully applying functional patterns on the tester a challenge. In fact, ...

This article is a condensed version of an article that appeared in the November/December 2022 issue of Chip Scale Review. Adapted with permission. Read the original ...

Testing is one of the most complex and critical parts of any new product or system development process. If debugging plays a fundamental role in improving the reliability of the product, analyzing its ...