Manufacturers are adopting automated optical inspection (AOI) systems based on phase shift profilometry (PSP) for applications in advanced packaging processes. Many of these processes use front ...
In this interview, Sue Berets, the Applications Scientist at Harrick Scientific, talks to AZoM about specular reflectance measurements and the difference between absolute and relative. Please tell us ...
Left: Schematic of the introduced prototype device for the measurement of specular surfaces, comprised of an unpolarized display and a polarization camera. Right: Measurement example: Object, camera ...
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