The performance and stability of smartphones and artificial intelligence (AI) services depend on how uniformly and precisely ...

Carbon nanotube sandpaper polishes semiconductor surfaces down to a few atoms, reducing defects by 67% and eliminating chemical slurry waste.

Light-emitting semiconductors are used throughout everyday life in TVs, smartphones, and lighting. However, many technical barriers remain in developing environmentally friendly semiconductor ...

ChEmpower Corp., a semiconductor materials company that develops polishing pads and chemical solutions, today announced Chakra, its first product designed to improve efficiency, reduce costs and ...

Silicon semiconductors are widely used as particle detectors; however, their long-term operation is constrained by performance degradation in high-radiation environments. Researchers at University of ...

One of the central tasks of physics is to understand how various materials possess certain properties such as electrical, optical, thermal, or magnetic properties. These properties underlie all ...

Quantum dots and semiconductor nanocrystals are nanoscale materials that exhibit distinctive optical and electronic properties due to quantum confinement effects. Their ability to emit light at ...

Quantum dot lasers and semiconductor photonics constitute a transformative field within modern optoelectronics, offering unique advantages for high‐density photonic integration and next‐generation ...

Shoreview, Minnesota, U.S.A., March 11, 2025 (GLOBE NEWSWIRE) -- TSI Incorporated, a global leader in precision measurement and data-driven solutions, announces the introduction of the new TSI Nano ...

What’s long been seen as a hindrance to electrical conduction in semiconductors may actually be an asset, at least in two-dimensional materials. The research team found that in atomically thin ...

Fastmicro B.V. is a manufacturer of surface particle defect detection systems and equipment established over 15 years ago. The main product lines include sample surface particle defect scanning, ...