In this article, 3D polymeric atomic force microscopy (AFM) tips, referred to as 3DTIPs, are introduced. The key differences between standard silicon AFM tips and the new 3DTIPs design will be covered ...

A team of researchers has developed new kind of Atomic Force Microscopy (AFM) probes in true three-dimensional shapes they call 3DTIPs. AFM technology allows scientists to observe, measure, and ...

A team of researchers from NYU Abu Dhabi's Advanced Microfluidics and Microdevices Laboratory (AMMLab) have developed new kind of Atomic Force Microscopy (AFM) probes in true three-dimensional shapes ...

Using a technique known as thermochemical nanolithography (TCNL), researchers have developed a new way to fabricate nanometer-scale ferroelectric structures directly on flexible plastic substrates ...

Since the invention of atomic force microscopy (AFM) 1, it has had widespread application in non-destructive sample surface imaging and significant interest in its magnetic, electrical, and mechanical ...

This release is available in German. Jena (21 October 2010) Scientists from the Friedrich-Schiller-University Jena (Germany) were successful in improving a fabrication process for Atomic Force ...

Atomic force microscopy is a powerful technique that has been widely used in materials research, nano-imaging, and bioimaging. It is a topographical metrology approach that is commonly utilized in ...

Scanning probe microscopy (SPM) is a set of advanced methods for surface analysis. The recent advances in SPM of metals, polymers, insulating, and semiconductive materials are primarily due to the ...