Semiconductor Engineering

Aging Aware Steepening Metric for the Fault Coverage of a Test Set (Purdue Univ.)

A new technical paper titled “Aging Aware Steepening of the Fault Coverage Curve of a Scan Based Transition Fault Test Set” ...
Semiconductor Engineering

Integrating Design Verification To Approach Zero Defects

As semiconductor applications in automotive, data center, and high-performance computing grow increasingly mission-critical, the industry faces mounting pressure to achieve near-perfect manufacturing ...
EDN

“Fault coverage analysis for ATPG generated vectors & random vectors”

•Average fault coverage for randomly generated test vectors was 60% or better depending on the type of circuit and the number of vectors applied (Max 98% or better). •Fault coverage for test vectors ...
EDN

Fault Coverage Analysis of Combinational Circuits using Atlanta-M

Examined and compared the fault coverage of random vectors and test vectors generated by ATPG tool. Exhaustive analysis was presented and results were based on faults covered for various benchmark ...