A newly drafted IEEE standard will bring more consistency to defect metrics in analog/mixed (AMS) designs, a long-overdue step that has become too difficult to ignore in the costly heterogeneous ...
Today's systematic and more subtle random defects are not only decreasing yields, but are also increasing the number of test escapes, or defective parts per million (DPPM) shipped out. One of the ...
At-speed testing and delay defect analysis have become increasingly critical in ensuring the reliability and performance of modern integrated circuits. As circuit complexity grows alongside rapid ...
A monthly overview of things you need to know as an architect or aspiring architect. Unlock the full InfoQ experience by logging in! Stay updated with your favorite authors and topics, engage with ...
Scan is a structured test approach in which the overall function of an integrated circuit (IC) is broken into smaller structures and tested individually. Every state element (D flip-flop or latch) is ...
When it comes to semiconductor device testing, the primary goal is to ensure that each device meets functional and performance specifications. Testing also plays a crucial role in confirming that ...
Siemens Digital Industries Software introduced a new tool called Tessent AnalogTest that helps simplify and accelerate the testing of analog and mixed-signal circuits — a long-standing bottleneck in ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results
Feedback